PanithanS / Wafers-Defect-Recognition-using-Visual-Transformer

We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.

Date Created 2023-09-28 (about a year ago)

Commits 61 (last one about a year ago)

Stargazers 25 (0 this week)

Watchers 0 (0 this week)

Forks 6

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All Topics

yeild wafermap mixedwm38 lithography data-analysis wafer-defects computer-vision defect-detection machine-learning yeild-opimization visual-transformer pattern-recognition defect-classification multilabel-classification semiconductor-manufacturing mixed-type-data-classification

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61 commits on the default branch (main) since jan '22

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PanithanS/Wafers-Defect-Recognition-using-Visual-Transformer

updated: 2024-12-25 @ 09:17am, id: 697869393 / R_kgDOKZikUQ