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PanithanS
Wafers-Defect-Recognition-using-Visual-Transformer PanithanS
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We use MixedWM38, the mixed-type wafer defect pattern dataset for wafer defect pattern regcognition with visual transformers.
yeild wafermap mixedwm38 lithography data-analysis wafer-defects computer-vision defect-detection machine-learning yeild-opimization visual-transformer pattern-recognition defect-classification multilabel-classification semiconductor-manufacturing mixed-type-data-classification
Created 2023-09-28
61 commits to main branch, last one about a year ago